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Scanning microscopy with spatial sampling of the detector plane
Journal article

Scanning microscopy with spatial sampling of the detector plane

Emilio Sanchez-Ortiga, Genaro Saavedra, Colin Sheppard, Ana Doblas, Manuel Martinez-Corral and Pedro Andres
Óptica pura y aplicada, Vol.46(2), pp.137-146
06/06/2013

Abstract

Optics Physical Sciences Science & Technology
url
https://doi.org/10.7149/OPA.46.2.137View
Published (Version of record) Open

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