Multi-state system reliability: An emerging paradigm for sophisticated engineered systems

Journal article

Peer reviewed

Yu Liu, Tangfan Xiahou, Qin Zhang, Liudong Xing and Hong-Zhong Huang

Frontiers of Engineering Management, Vol.11(3), pp.568-575

09/2024

Abstract

Civil Engineering

Comments

Engineering

Industrial and Production Engineering

Operations Management

1 Record Views

Title: Multi-state system reliability: An emerging paradigm for sophisticated engineered systems
Creators: Yu Liu - University of Electronic Science and Technology of China
Tangfan Xiahou - University of Electronic Science and Technology of China
Qin Zhang - University of Electronic Science and Technology of China
Liudong Xing - University of Massachusetts Dartmouth
Hong-Zhong Huang - University of Electronic Science and Technology of China
Publication Details: Frontiers of Engineering Management, Vol.11(3), pp.568-575
Publisher: Higher Education Press
Number of pages: 8
Language: English
Academic Unit: Department of Electrical and Computer Engineering
Resource Type: Journal article
DOI: https://doi.org/10.1007/s42524-024-0140-8
Record Identifier: 9914432614801301