Error analysis of a finite difference scheme for the epitaxial thin film growth model with slope selection with an improved convergence constant

Journal article

Zhonghua Qiao, Cheng Wang, Steven Wise and Zhengru Zhang

International Journal of Numerical Analysis and Modeling, Vol.14(2), pp.283-305

2017

Abstract

Computational Mathematics

Finite Mathematics

Mathematics

1 Record Views

Title: Error analysis of a finite difference scheme for the epitaxial thin film growth model with slope selection with an improved convergence constant
Creators: Zhonghua Qiao - Hong Kong Polytechnic University
Cheng Wang - University of Massachusetts Dartmouth, Department of Mathematics
Steven Wise - University of Tennessee at Knoxville
Zhengru Zhang - Beijing Normal University
Publication Details: International Journal of Numerical Analysis and Modeling, Vol.14(2), pp.283-305
Academic Unit: Department of Mathematics
Language: English
Resource Type: Journal article
Record Identifier: 9914530113701301