Convergence in Optical and Digital Pattern Recognition: introduction to the feature issue

Journal article

Peer reviewed

Abdul Awwal, Khan Iftekharuddin, Mohammad Karim, Mark Neifeld and David Stork

Applied optics (2004), Vol.49(10), pp.DPR1-DPR2

04/01/2010

PMID: 20357847

Abstract

Optics

Physical Sciences

Science & Technology

1 Record Views

Title: Convergence in Optical and Digital Pattern Recognition: introduction to the feature issue
Creators: Abdul Awwal - Lawrence Livermore Natl Lab, Natl Ignit Facil, Livermore, CA 94551 USA
Khan Iftekharuddin - University of Memphis
Mohammad Karim - Old Dominion University
Mark Neifeld - University of Arizona
David Stork - Ricoh (United States)
Publication Details: Applied optics (2004), Vol.49(10), pp.DPR1-DPR2
Publisher: Optical Soc Amer
Number of pages: 2
Academic Unit: Department of Electrical and Computer Engineering
Language: English
Resource Type: Journal article
DOI: https://doi.org/10.1364/AO.49.00DPR1
Record Identifier: 9914539736301301