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Artifact-Free Dark-Field Scattering Microspectroscopy for Single-Particle Chiral Measurements at the Nanoscale
Journal article   Peer reviewed

Artifact-Free Dark-Field Scattering Microspectroscopy for Single-Particle Chiral Measurements at the Nanoscale

Angel Rose Thomas, Vidhi Singla, Oscar Avalos-Ovando, Trang Nguyen, Tamie Vo, Alexander O Govorov and Wei-Shun Chang
ACS nano
01/19/2026
PMID: 41549775

Abstract

dark-field spectroscopy linear dichroism chiral plasmonic nanostructures circular differential scattering single-particle analysis

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