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Optimal Reliability of Series and Parallel Systems subject to Two Failure Modes considering Correlated Failures
Conference proceeding

Optimal Reliability of Series and Parallel Systems subject to Two Failure Modes considering Correlated Failures

Anusha Krishna Murthy, Saikath Bhattacharya and Lance Fiondella
ISSAT International Conference on Reliability and Quality in Design, 23, pp.249-253
01/01/2017

Abstract

Blockdiagramm Kostenminimierung Minimalkosten serielles System Versagensart

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