Connecting Software Reliability Growth Models to Software Defect Tracking

Conference proceeding

Maskura Nafreen, Melanie Lupero, Vidhyashree Nagaraju, Ying Shi, Lance Fiondella and Thierry Wandji

2020 IEEE 31st International Symposium on Software Reliability Engineering (ISSRE) (Coimbra, Portugal, 10/12/2020–10/15/2020)

11/11/2020

Abstract

Computer Programming And Software

This presentation proposes a method for including the defect discovery process into the software reliability growth model.

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Title: Connecting Software Reliability Growth Models to Software Defect Tracking
Creators: Maskura Nafreen - University of Massachusetts Dartmouth
Melanie Lupero - University of Massachusetts Dartmouth
Vidhyashree Nagaraju - University of Tulsa
Ying Shi - Goddard Space Flight Center
Lance Fiondella - University of Massachusetts Dartmouth
Thierry Wandji - Naval Air Systems Command
Conference: 2020 IEEE 31st International Symposium on Software Reliability Engineering (ISSRE) (Coimbra, Portugal, 10/12/2020–10/15/2020)
Publisher: IEEE
Number of pages: 10
Grant note: National Aeronautics and Space Administration (NASA): 80NSSC18K0154 NSF: 1749635 Division Of Computer and Network Systems; Direct For Computer & Info Scie & Enginr: 1749635
This work was supported by the National Aeronautics and Space Administration (NASA) under Grant Number (#80NSSC18K0154) and NSF award (#1749635). Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the sponsors.
Academic Unit: Department of Electrical and Computer Engineering
Language: English
Resource Type: Conference proceeding
ISBN: 978-1-7281-9870-5
DOI: https://doi.org/10.1109/ISSRE5003.2020.00022
Record Identifier: 9914432398101301