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A new CBDD model for deterministic competing failure analysis
Conference proceeding

A new CBDD model for deterministic competing failure analysis

Chaonan Wang, Liudong Xing and Yujie Wang
2017 Second International Conference on Reliability Systems Engineering (ICRSE), pp.1-6
07/2017

Abstract

Algorithm design and analysis Analytical models competing binary decision diagram competing failures Fault trees functional dependence Heuristic algorithms Logic gates Reliability reliability analysis

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